Speaker: Dr. Emmanuel Wenger and Prof. Dr. Dominik Schaniel, CRM2 Université de Lorraine, Nancy, France.

Topic:
Crystallography of functional materials aims for explaining the observed functional properties based on the underlying structural features, ideally in in-operando or in-situ conditions. We present a laboratory single-crystal X-ray diffraction (XRD) setup designed for the measurement of static and time-resolved XRD patterns as a function of temperature, light irradiation, pressure, and electric field. Moreover, our setup allows for in-situ measurement of the optical (luminescence, absorption) properties upon continuous wave (cw) or pulsed Laser excitation of the sample. The time-resolution of the optical experiments is nanoseconds while the time resolution of the XRD is milliseconds. Using this setup, we can investigate numerous phenomena induced by the external stimuli and derive structure-property relationships. After the introduction of the measurement principle and addressing some metrological questions, we show through the example of photoinduced linkage isomers how the combination of XRD with in-situ static and transient absorption spectroscopy can help understand the underlying photoswitching mechanism [1,2].

[1] Hasil, A., Konieczny, K.A., Mikhailov, A., Pillet, S & Schaniel D. (2024). ChemPhotoChem. 8, e202300149.
[2] Casaretto, N., Schaniel, D., Alle, P., Wenger, E., Parois, P., Fournier, B., Bendeif, E.-E., Palin, C. & Pillet S. (2017) Acta Cryst. B73, 696

Series: STOE User Talks 2025/2026

Time: 47 min.